1. Atanasova E.D., Kovchavtsev A.P. Interface properties of Metal/Oxide/Semiconductor Structures with ultrayhin Plasma SiO2. Thin Solid Films, 1983, 100, 131-139.
  2. A.A. Frantsuzov, A.P. Kovchavtsev. The Determination of Surface Potential Fluctation Values and Spatial Distribution of Traps in Insulators from the Temperature Dependence of the (Gp/ω)- ω Curves of MOS Structures. Phys. Stat. Sol. (a), 1983, 79, 503 – 511.