LABORATORY OF NON-EQUILIBRIUM SEMICONDUCTOR SYSTEMS

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INSTITUTE OF SEMICONDUCTOR PHYSICS, SIBERIAN BRANCH OF THE RUSSIAN ACADEMY OF SCIENCES

 

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POST-GRADUATES AND CO-RESEARCHERS

Vladimir A. Zinovyev,

researcher,

PhD in phys.-math. sci.

Scientific activities:

  • modelling of low-energy ions interaction with a solid surface,
  • investigation of semiconductor heterostructures growth under ion radiation,
  • studying elastic and plastic relaxation in nanodimensional systems.

Educational background:

  • graduated from the Novosibirsk Electrotechnical Institute on the speciality "Physical electronics" (0641)

Empoyment activities:

  • since 1989 — has been an ISP SB RAS staffer.
  • In 2004 he defended his PhD thesis in "Processes on silicon surface under low-energy ion impact in MBE cnditions".
  • Presently. he is a staffer of the laboratory of non-euilibrium semiconductor systems as a researcher.

Selected publications:

  1. Zinovyev V.A., Aleksandrov L.N. and Dvurechenskii A.V., Heinig K.-H., Stock D. Modelling of layer-by-layer sputtering of Si(111) surfaces under irradiation with low-energy ions. – Thin Solid Films, 1994, v.241, p.167-170.
  2. Äâóðå÷åíñêèé À.Â., Çèíîâüåâ Â.À., Ìàðêîâ Â.À. Ìåõàíèçì ñòðóêòóðíûõ èçìåíåíèé ïîâåðõíîñòè êðåìíèÿ èìïóëüñíûì âîçäåéñòâèåì íèçêîýíåðãåòè÷åñêèìè èîíàìè ïðè ýïèòàêñèè èç ìîëåêóëÿðíîãî ïó÷êà. – ÆÝÒÔ, 1998, ò.67, ñ. 2055-2064.
  3. Äâóðå÷åíñêèé À.Â., Çèíîâüåâ Â.À., Ñìàãèíà Æ.Â. Ýôôåêòû ñàìîîðãàíèçàöèè àíñàìáëÿ íàíîîñòðîâêîâ Ge ïðè èìïóëüñíîì îáëó÷åíèè íèçêîýíåðãåòè÷åñêèìè èîíàìè â ïðîöåññå ãåòåðîýïèòàêñèè íà Si.- Ïèñüìà â ÆÝÒÔ, 2001, ò. 74, c. 296-299
  4. Dvurechenskii A.V., Smagina J.V., Groetzschel R., Zinovyev V.A., Armbrister V.A., Novikov P.L., Teys S.A., Gutakovskii A.K. Ge/Si quantum dot nanostructures grown with low-energy ion beam-assisted epitaxy. - Surface and Coatings Technology, 2005, v.196, p. 25-29.
  5. V. A. Zinovyev, G. Vastola, F. Montalenti, and Leo Miglio, Accurate and analytical strain mapping at the 3 surface of Ge/Si(001) islands by an improved flat-island approximation.- Surface Science, 2006, v. 600, p.4777-47842.
  6. G. Capellini, M. De Seta, and F. Evangelisti, V. A. Zinovyev, G. Vastola, F. Montalenti, and Leo Miglio, Self-Ordering of a Ge Island Single Layer Induced by Si Overgrowth.- Phys. Rev. Lett. 2006, v.96, p. 106102
  7. Marzegalli A., Zinovyev V.A., Montalenti F., Rastelli A., Stoffel M., Merdzhanova T., Schmidt O.G., Miglio L., Critical Shape and Size for Dislocation Nucleation in Si1-x Gex islands on Si(001). - Phys. Rev. Lett., 2007, v.99, p. 235505
  8. Ñìàãèíà Æ.Â., Çèíîâüåâ Â.À., Íåíàøåâ À.Â., Äâóðå÷åíñêèé À.Â., Àðìáðèñòåð Â.À., Òèéñ Ñ.À. Ñàìîîðãàíèçàöèÿ íàíîîñòðîâêîâ ãåðìàíèÿ ïðè èìïóëüñíîì îáëó÷åíèè ïó÷êîì íèçêîýíåðãåòè÷åñêèõ èîíîâ â ïðîöåññå ãåòåðîýïèòàêñèè ñòðóêòóð Ge/Si(100).- ÆÝÒÔ, 2008, ò. 133, ñ. 593-604.
  9. Gatti R., Marzegalli A., Zinovyev V. A., Montalenti F., Miglio L. Improved modeling of plastic relaxation onset in realistic SiGe islands on Si(001).- Phys. Rev. B, 2008, v.78, p.184104

Last update: 05/07/2010

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